Scanning Electron Microscope(SEM)
SEM Scanning Electron Microscope(SEM) Scanning electron microscope is a one of the particle analytical method. SEM is one of the type of electron microscope. Here we using the single electron ray which is kinetically ejected from the electron gun. The ejected single electron powerfully hits the specimen which is known as sample and placed in the holder, the secondary electron rays is produced by the sample and secondary electrons are commonly detected by an Everhart-Thornley detector . the secondary electrons are contains the different kinds of properties and the detector has counted the number of rays are scattered by the sample. the detected signal intensity is depends on the specimen topography. Schematic representation of SEM: SEM can achieve 1 nm Principal of SEM Accelerated electrons i...